Welcome, guest! Login / Register - Why register?
Psst.. new poll here.
[email protected] web/email now available. Want one? Go here.
Cannot use outlook/hotmail/live here to register as they blocking our mail servers. #microsoftdeez
Obey the Epel!

Paste

Pasted as Plain Text by ZZaiatSS ( 15 years ago )
=== START OF INFORMATION SECTION ===
Device Model:     Hitachi HTS542525K9SA00
Serial Number:    080930BB6F00WDFSXZKF
Firmware Version: BBFOC31P
User Capacity:    250.059.350.016 bytes
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 3f
Local Time is:    Sat Nov 21 23:33:15 2009 EET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00) Offline data collection activity
     was never started.
     Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0) The previous self-test routine completed
     without error or no self-test has ever 
     been run.
Total time to complete Offline 
data collection:    ( 645) seconds.
Offline data collection
capabilities:     (0x5b) SMART execute Offline immediate.
     Auto Offline data collection on/off support.
     Suspend Offline collection upon new
     command.
     Offline surface scan supported.
     Self-test supported.
     No Conveyance Self-test supported.
     Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
     power-saving mode.
     Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
     General Purpose Logging supported.
Short self-test routine 
recommended polling time:   (   2) minutes.
Extended self-test routine
recommended polling time:   ( 107) minutes.
SCT capabilities:         (0x003d) SCT Status supported.
     SCT Feature Control supported.
     SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000b   100   100   062    Pre-fail  Always       -       0
  2 Throughput_Performance  0x0005   100   100   040    Pre-fail  Offline      -       0
  3 Spin_Up_Time            0x0007   245   245   033    Pre-fail  Always       -       1
  4 Start_Stop_Count        0x0012   100   100   000    Old_age   Always       -       51
  5 Reallocated_Sector_Ct   0x0033   100   100   005    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000b   100   100   067    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0005   100   100   040    Pre-fail  Offline      -       0
  9 Power_On_Hours          0x0012   100   100   000    Old_age   Always       -       64
 10 Spin_Retry_Count        0x0013   100   100   060    Pre-fail  Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       50
191 G-Sense_Error_Rate      0x000a   100   100   000    Old_age   Always       -       0
192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age   Always       -       6
193 Load_Cycle_Count        0x0012   100   100   000    Old_age   Always       -       634
194 Temperature_Celsius     0x0002   137   137   000    Old_age   Always       -       40 (Lifetime Min/Max 20/52)
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0022   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0008   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x000a   200   200   000    Old_age   Always       -       0
223 Load_Retry_Count        0x000a   100   100   000    Old_age   Always       -       0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

 

Revise this Paste

Your Name: Code Language: